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Robert Schmidt authored
- throughput test in DL - UL throughput: 30s is enough - increase bidir test time for more reliable measurement - increase retx thresholds: 1% for first round is too low
728649d6
- throughput test in DL - UL throughput: 30s is enough - increase bidir test time for more reliable measurement - increase retx thresholds: 1% for first round is too low